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Diagnostic characterization techniques for semiconductor materials devices and device processing are addressed at this symposium. As with all of these lecture slides I am indebted to Dr. Cristea Department of Electronic Devices Circuits and Architectures Politehnica University of Bucharest Romania Abstract A new capacitance-voltage profiling technique of semiconductor junctions is proposed for characterisation of semiconductor materials and devices. 7Laboratorio de Optica de Materiais - OptiMa-UFAM. Georgia Institute of Technology. The University of Texas at Austin.
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